EVALUATION THE EFFECT OF GROWTH VOLTAGE ON THE PROPERTIES CdTe THIN FILMS
2025 Volume 16
A.M. Aliyu,,Department of Physics, Aliko Dangote University of Science & Technology, Wudil
D.G. Diso,,Department of Physics, Aliko Dangote University of Science & Technology, Wudil
A.O Musa,,Department of Physics, Aliko Dangote University of Science & Technology, Wudil
A M Aliyu,,
Abstract:
Cadmium Telluride (CdTe) thin films have attracted considerable attention due to their broad applications in optoelectronic and solar cells devices. This study explored the impact of growth voltage on the optical and structural properties of electrodeposited CdTe films using UV spectroscopy and XRD characterization respectively. CdTe thin films were deposited on fluorene-doped tin oxide (FTO) coated glass substrates at various growth voltages ranging from 1300mV to 1600mV. The optical bandgap of CdTe films were found to be 1.54 to 1.61 eV which was within the range of the bandgap of the bulk materials. The XRD analysis indicated that all the deposited films exhibited a cubic Zinc blende structure with a preferred orientation along the (111) plane.
Keyward(s): CdTe, Growth voltage, Optical bandgap, Thin films, UV spectroscopy, X-ray diffraction (XRD).
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